Keysight Technologies Co-Sponsors Seminar Detailing Device Characterization Challenges and Solutions within the Amplifier Design Flow

  
  
        

What:

Keysight is co-sponsoring a free seminar with Maury Microwave to explore various interconnected topics of device characterization that form the amplifier design flow, from component to circuit to system measurement and modeling. Additional topics include pulsed IV and S-parameters for compact model extraction, load pull for model validation and measurement, amplifier design and IC stability analysis, X-parameter modeling and system-level simulations.

During the Amplifier Design Flow — From Component to Circuit to System Measurement & Modeling seminar, instructors from Keysight and Maury Microwave will provide technical instruction and measurement demonstrations. Attendees will also have the opportunity to interact with experienced applications engineers.

When:

Wednesday, Sept. 23 and Wednesday, Sept. 30

Where:

Sept. 23 Event: Linthicum, MD, Hilton Baltimore BWI Airport
1739 West Nursery Road, Linthicum, MD

Sept. 30 Event: Greensboro, NC, Greensboro-High Point Marriott Airport
1 Marriott Drive, Greensboro, NC

Registration is required to attend.

Additional
Information:

www.keysight.com/find/events

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Contacts:

Janet Smith, Americas
+1 970 679 5397
janet_smith@keysight.com
Twitter: @KeysightJSmith

Sarah Calnan, Europe
+44 (118) 927 5101
sarah_calnan@keysight.com

Connie Wong, Asia
+852 3197-7818
connie-ky_wong@keysight.com