Images for Press Release

Agilent 4080 Series Parametric Test Systems

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

Agilent 4080 Series of Parametric Testers is a modular and expandable production test platform that covers the full range of measurement requirements from mainstream processes to advanced processes beyond 45nm and will allow customers to easily add new testing capabilities, such as NAND/NOR flash memory cell characterization and RF S-parameter measurement.

Image 1:
Agilent 4080 Series of Parametric Testers is a modular and expandable production test platform that covers the full range of measurement requirements from mainstream processes to advanced processes beyond 45nm and will allow customers to easily add new testing capabilities, such as NAND/NOR flash memory cell characterization and RF S-parameter measurement.

Download JPEG (0.8MB)

Download TIF (1.7MB)

 

Related Information
  Press Release:

Agilent Technologies' New Parametric Test Platform Offers Unprecedented Performance for Engineers in Semiconductor Fabs, Research Environments
(2007-April-02)

  Keysight Photography Use Policy:

We will permit use of Keysight photography available via this site as long as the use will not disparage Keysight nor imply endorsement by Keysight. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Keysight Technologies.

ALL IMAGES USED MUST INDICATE:
"Reproduced with Permission, Courtesy of Keysight Technologies, Inc."

  How do I download images:

To download files in Windows, use the right mouse button on the desired format (JPEG or TIFF) and choose 'Save Target As...'