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Agilent Technologies' Array Structure Parametric Test Solution Wins Best Product Award from Semiconductor International

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With the new Agilent N9201A, Agilent's 4070 testers are the first production parametric testers with the throughput needed to make parametric test a viable option for the yield ramp-up phase. The Agilent 4070 with the Agilent N9201A is the first production parametric tester with a per-channel SMU (source/monitor unit) architecture that supports up to 40 total SMUs, for extremely fast characterization of in-line array test structures.

Image 1: Agilent 4070 Parametric Tester with new Agilent N9201A
With the new Agilent N9201A, Agilent's 4070 testers are the first production parametric testers with the throughput needed to make parametric test a viable option for the yield ramp-up phase. The Agilent 4070 with the Agilent N9201A is the first production parametric tester with a per-channel SMU (source/monitor unit) architecture that supports up to 40 total SMUs, for extremely fast characterization of in-line array test structures.

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Related Information
  Press Release:

Agilent Technologies' Array Structure Parametric Test Solution Wins Best Product Award from Semiconductor International
(2008-July-29)
  Press Release:

Agilent Technologies brings parametric test to new market, allows manufacturers to accelerate yield ramp-up phase
(2006-October-02)
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