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Keysight's new NX5730A High-Throughput 1 ns Pulsed IV Memory Test Solution

  
  

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Keysight NX5730A high-throughput 1 ns pulsed IV memory test solution

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Keysight’s new NX5730A High-Throughput 1 ns Pulsed IV Memory test solution is a dedicated solution for researchers and engineers struggling with the characterization of MTJ devices on silicon wafers.

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