What: |
Keysight is co-sponsoring a free seminar with Maury Microwave to explore various interconnected topics of device characterization that form the amplifier design flow, from component to circuit to system measurement and modeling. Additional topics include pulsed IV and S-parameters for compact model extraction, load pull for model validation and measurement, amplifier design and IC stability analysis, X-parameter modeling and system-level simulations. During the Amplifier Design Flow — From Component to Circuit to System Measurement & Modeling seminar, instructors from Keysight and Maury Microwave will provide technical instruction and measurement demonstrations. Attendees will also have the opportunity to interact with experienced applications engineers. |
When: |
Wednesday, Sept. 23 and Wednesday, Sept. 30 |
Where: |
Sept. 23 Event: Linthicum, MD, Hilton Baltimore BWI Airport Sept. 30 Event: Greensboro, NC, Greensboro-High Point Marriott Airport |
Additional |
# # #
Contacts:
Janet Smith, Americas
+1 970 679 5397
[email protected]
Twitter: @KeysightJSmith
Sarah Calnan, Europe
+44 (118) 927 5101
[email protected]
Connie Wong, Asia
+852 3197-7818
[email protected]