Keysight Technologies to Showcase Semiconductor Parametric, Modeling Solutions at the International Reliability Physics Symposium



Keysight will demonstrate some of its many semiconductor parametric and modeling solutions at the 54th International Reliability Physics Symposium (IRPS), the world’s premier platform for presenting pioneering work in semiconductor reliability. 

Keysight application experts will be on hand to demonstrate the B2900A SMU and EasyEXPERT group+ software, which can control four 2-channel B2900A SMU mainframes as well as other equipment (e.g., a thermal test chamber); and the CX3322A current waveform analyzer, which can display never before visible low-level current waveforms.

Also to be demonstrated are end-to-end solutions for semiconductor device characterization and compact modeling for semiconductor device characterization and SPICE model extraction, including automatic on-wafer measurement, 1/f noise and RTN measurement, reliability modeling, advanced model extraction flows, and automatic and intelligent qualification of SPICE libraries (e.g., AgeMOS, MOSRA, and TMI reliability models). These semiconductor parametric and modeling solutions are critical to helping designers characterize and model cutting-edge CMOS and compound semiconductor devices.

Additional information about IRPS is available at


April 19–21


54th International IRPS
Pasadena Convention Center, Booth 133/2135
Pasadena, CA


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Janet Smith, Americas
+1 970 679 5397
Twitter: @KeysightJSmith

Sarah Calnan, Europe
+44 (118) 927 5101

Connie Wong, Asia
+852 3197-7818