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Agilent Technologies, Solution Sources Programming Announce Additional In-Circuit Test Capacity at Solution Sources

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Agilent Medalist i3070 In-circuit Test system

Image 1:
Agilent Medalist i3070 In-circuit Test system.

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Advanced algorithms and user-friendly interfaces on the Medalist i3070 help bring the power of in-circuit test to manufacturers.

Image 2:
Advanced algorithms and user-friendly interfaces on the Medalist i3070 help bring the power of in-circuit test to manufacturers.

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Related Information
  Press Release:

Agilent Technologies' Cover-Extend Technology for In-Circuit Test Wins Major Awards at IPC APEX 2009
(2009-April-01)
  Press Release:

Agilent Technologies, Solution Sources Programming Announce Additional In-Circuit Test Capacity at Solution Sources
(2008-November-18)
  Press Release:

Agilent Technologies Introduces Fastest, Easiest Way to Bring Power of In-Circuit Test to Production Lines
(2007-February-20)
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