Images for Press Release

Agilent Technologies' New Cover-Extend Technology Eliminates the Need for Physical Test Points for In-Circuit Test

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Image 1:
Cover-Extend leverages existing VTEP hardware such as the VTEP probes and MUX card.

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Image 2:
Cover-Extend enables unsurpassed ICT coverage on the Medalist i3070 platform.

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VTEP MUX Card

Image 3:
VTEP MUX Card

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VTEP sensor plate with probes

Image 4:
VTEP sensor plate with probes

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Related Information
  Press Release:

Agilent Technologies' New Cover-Extend Technology Eliminates the Need for Physical Test Points for In-Circuit Test
(2008-March-20)
  Press Release:

Agilent Technologies Introduces First-Ever In-Circuit Vectorless Test Technique with Network Parameter Measurement Technology
(2007-February-20)
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