Introducing Keysight's IC-CAP 2016, MBP 2016 and MQA 2016

  
  

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

IC-CAP DynaFET Extraction Package.

Image 1:
IC-CAP DynaFET Extraction Package.

Low-JPEG Download (0.4MB)

High-JPEG Download (1.2MB)

IC-CAP WaferPro for wafer-level automated measurements.

Image 2:
IC-CAP WaferPro for wafer-level automated measurements.

Low-JPEG Download (0.4MB)

High-JPEG Download (1.2MB)

MBP latest corner modeling module showing corner plot, tuning and parameter tables.

Image 3:
MBP latest corner modeling module showing corner plot, tuning and parameter tables.

Low-JPEG Download (0.3MB)

High-JPEG Download (0.7MB)

MQA shows n/p correlation, corner model and statistical model.

Image 4:
MQA shows n/p correlation, corner model and statistical model.

Low-JPEG Download (0.5MB)

Related Information
Press Release:
Keysight Technologies Unveils Latest Release of its Semiconductor Device Modeling and Characterization Software Tool Suite
(2016-February-22)

Keysight Photography Use Policy:

We will permit use of Keysight photography available via this site as long as the use will not disparage Keysight nor imply endorsement by Keysight. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Keysight Technologies.

ALL IMAGES USED MUST INDICATE:
"Reproduced with Permission, Courtesy of Keysight Technologies, Inc."

How do I download images:

To download files in Windows, use the right mouse button on the desired format (JPEG or TIFF) and choose 'Save Target As...'