Keysight Technologies, Cascade Microtech Celebrate 25 Years of Solving Customers' Semiconductor R&D Challenges
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In 1999 Keysight (as Agilent) introduced the world’s first broadband, single sweep on-wafer measurements with the 8510XF using a Cascade Microtech Summit 9000 wafer probing solution and ACP-110 probes.
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This photo shows a typical configuration of a turn-key wafer level measurement solution containing Keysight measurement instruments and the Cascade Microtech Summit 12000 probe station and Infinity probes.
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