Introducing Keysight Technologies' WaferPro Express 2015

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

Image 1:
WaferPro Express 2015 after executing a parametric DC test plan at different temperatures with wafer map test status and data display.

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Related Information
Press Release:
Keysight Technologies Unveils WaferPro Express 2015 Platform for Wafer-Level Device Characterization
(2015-April-28)

Keysight Photography Use Policy:

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