Keysight Technologies Collaborates with Leading Research Centers in Europe, Middle East, Africa, India to Reach Milestone in Low-Frequency Noise Measurement

  
  

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Keysight A-LFNA paired with Keysight B1500 Semiconductor Device Analyzer

Image 1:
The Keysight A-LFNA is shown here paired with the Keysight B1500 Semiconductor Device Analyzer, used as a source measurement unit (SMU).

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Keysight A-LFNA software runs on top of Keysight WaferPro Express providing automated on-wafer measurements with a number of probe stations, including Cascade Microtech CM300

Image 2:
The Keysight A-LFNA software runs on top of the Keysight WaferPro Express facilitating automated on-wafer measurements with a number of probe stations, including this latest CM300 from Cascade Microtech.

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Related Information
Press Release:
Keysight Technologies Collaborates with Leading Research Centers in Europe, Middle East, Africa, India to Reach Milestone in Low-Frequency Noise Measurement
(2018-February-05)

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