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Keysight Technologies Collaborates with Leading Research Centers in Europe, Middle East, Africa, India to Reach Milestone in Low-Frequency Noise Measurement

  
  

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

Keysight A-LFNA paired with Keysight B1500 Semiconductor Device Analyzer

Image 1:
The Keysight A-LFNA is shown here paired with the Keysight B1500 Semiconductor Device Analyzer, used as a source measurement unit (SMU).

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Keysight A-LFNA software runs on top of Keysight WaferPro Express providing automated on-wafer measurements with a number of probe stations, including Cascade Microtech CM300

Image 2:
The Keysight A-LFNA software runs on top of the Keysight WaferPro Express facilitating automated on-wafer measurements with a number of probe stations, including this latest CM300 from Cascade Microtech.

Low-JPEG Download (0.2MB)

High-JPEG Download (1.4MB)

Related Information

Keysight Photography Use Policy:

We will permit use of Keysight photography available via this site as long as the use will not disparage Keysight nor imply endorsement by Keysight. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Keysight Technologies.

ALL IMAGES USED MUST INDICATE:
"Reproduced with Permission, Courtesy of Keysight Technologies, Inc."

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