Keysight Technologies Collaborates with Leading Research Centers in Europe, Middle East, Africa, India to Reach Milestone in Low-Frequency Noise Measurement
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The Keysight A-LFNA is shown here paired with the Keysight B1500 Semiconductor Device Analyzer, used as a source measurement unit (SMU).
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The Keysight A-LFNA software runs on top of the Keysight WaferPro Express facilitating automated on-wafer measurements with a number of probe stations, including this latest CM300 from Cascade Microtech.
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