Keysight's new NX5730A High-Throughput 1 ns Pulsed IV Memory Test Solution

  
  

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

Keysight NX5730A high-throughput 1 ns pulsed IV memory test solution

Image 1:
Keysight’s new NX5730A High-Throughput 1 ns Pulsed IV Memory test solution is a dedicated solution for researchers and engineers struggling with the characterization of MTJ devices on silicon wafers.

Low-JPEG Download (0.2MB)

High-JPEG Download (3.1MB)

Related Information
Press Release:
Keysight Technologies Announces High-Throughput 1 ns Pulsed IV Memory Test Solution—Accelerates Development, Commercialization of New Memory, Including STT-MRAM
(2017-September-18)

Keysight Photography Use Policy:

We will permit use of Keysight photography available via this site as long as the use will not disparage Keysight nor imply endorsement by Keysight. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Keysight Technologies.

ALL IMAGES USED MUST INDICATE:
"Reproduced with Permission, Courtesy of Keysight Technologies, Inc."

How do I download images:

To download files in Windows, use the right mouse button on the desired format (JPEG or TIFF) and choose 'Save Target As...'