Keysight Technologies P9000 series massively parallel parametric test system

  
  

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

Keysight P9000 series Parametric Test Solution with Tokyo Electron Wafer Prober Precio

Image 1:
Keysight Technologies newest P9000 series further accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs.

Low-JPEG Download (0.2MB)

High-JPEG Download (0.4MB)

Keysight P9000 series Parametric Test Solution with Accretech Wafer Prober UF3000EX

Image 2:
Keysight Technologies newest P9000 series further accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs.

Low-JPEG Download (0.2MB)

High-JPEG Download (0.6MB)

Related Information
Press Release:
Keysight Technologies' New Third-Generation Parametric Test Solution Reduces Time-To-Market, Lowers Cost-Of-Test
(2018-January-08)

Keysight Photography Use Policy:

We will permit use of Keysight photography available via this site as long as the use will not disparage Keysight nor imply endorsement by Keysight. The photography cannot be changed or manipulated in any way with the exception of resizing or cropping. By downloading our product photography you are indicating that you accept these terms. Any commercial use of these images must be approved by Keysight Technologies.

ALL IMAGES USED MUST INDICATE:
"Reproduced with Permission, Courtesy of Keysight Technologies, Inc."

How do I download images:

To download files in Windows, use the right mouse button on the desired format (JPEG or TIFF) and choose 'Save Target As...'