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Keysight Technologies P9000 series massively parallel parametric test system

  
  

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Keysight P9000 series Parametric Test Solution with Tokyo Electron Wafer Prober Precio

Image 1:
Keysight Technologies newest P9000 series further accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs.

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Keysight P9000 series Parametric Test Solution with Accretech Wafer Prober UF3000EX

Image 2:
Keysight Technologies newest P9000 series further accelerates the fast ramp of new technology and reduces the cost-of-test in the development and manufacturing of advanced semiconductor logic and memory ICs.

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