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Keysight Technologies' Low-Frequency Noise Measurement System Adopted by China CEPREI Laboratory for Reliability Studies

  
  

System Eases Measurement, Analysis of Flicker Noise, Random Telegraph Noise

Highlights:

  • Allows accurate measurement of semiconductor device with low system noise
  • Enables CEPREI to study a broad range of devices and applications

SANTA ROSA, Calif., Jan. 25, 2016

Keysight Technologies, Inc. (NYSE: KEYS) today announced that CEPREI Laboratory has successfully adopted the Keysight EEsof EDA E4727A Advanced Low-Frequency Noise Analyzer (A-LFNA) for measurement and analysis of flicker noise (1/f noise) and random telegraph noise (RTN) during its reliability studies of semiconductor devices including MOSFETs, HEMTs and TFTs.

Keysight EDA's E4727A is a high-performance noise analyzer designed to make fast, accurate and repeatable low-frequency noise (LFN) measurements. Offering support for wafer mapping measurement and data analysis of 1/f noise and RTN, as well as repeatable and reliable measurement results, the analyzer is well suited for the development, qualification and monitoring of semiconductor materials and IC manufacturing processes.

CEPREI Laboratory, also known as the China Electronic Product Reliability and Environmental Testing Research Institute, is the first scientific research organization to engage in product quality and reliability research in China. As the affiliated institute directly under the Ministry of Industry and Information Technology (MIIT), CEPREI provides technical support and services not only for industrial management of MIIT and local government, but also for over 10,000 electronic information companies every year.

"The E4727A solution from Keysight was chosen after careful technical evaluation," said Dr. Liu Yuan, senior engineer at CEPREI. "Its superior performance ensures accurate measurement results with low system noise, while having the industry's widest frequency and bias measurement range allow us to study various devices and applications. We look forward to further cooperation with Keysight on a calibration method and its standardization."

"We are pleased that CEPREI has become yet another reference site for our low-frequency noise measurement system," said Dr. MA Long, device modeling product manager at Keysight EEsof EDA. "Low-frequency noise is a sensitive and important indicator of semiconductor material and manufacturing processes, and is widely used in reliability, new materials and novel device research. Keysight is committed to boosting the relevant activities by strengthening our collaboration with top research institutes such as CEPREI, and other universities throughout the world."

More information about Keysight EDA's A-LFNA is available at www.keysight.com/find/eesof-a-lfna.

About Keysight EEsof EDA Software

Keysight EEsof EDA is the leading supplier of electronic design automation software for microwave, RF, high-frequency, high-speed digital, RF system, electronic system level, circuit, 3-D electromagnetic, physical design and device-modeling applications. More information is available at www.keysight.com/find/eesof.


About Keysight Technologies

Keysight Technologies (NYSE: KEYS) is a global electronic measurement technology and market leader helping to transform its customers' measurement experience through innovations in wireless, modular, and software solutions. Keysight's electronic measurement instruments, systems, software and services are used in the design, development, manufacture, installation, deployment and operation of electronic equipment. The business had revenues of $2.9 billion in fiscal year 2015. Information about Keysight is available at www.keysight.com.

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Contact:

Janet Smith, Americas
+1 970 679 5397
janet_smith@keysight.com
Twitter: @KeysightJSmith

Sarah Calnan, Europe
+44 (118) 927 5101
sarah_calnan@keysight.com

Connie Wong, Asia
+852 3197-7818
connie-ky_wong@keysight.com