Keysight Technologies, Cascade Microtech Celebrate 25 Years of Solving Customers' Semiconductor R&D Challenges

  
  

The following product photos are available for use by the media, based on the Keysight Photography Use Policy.

In 1999 Keysight (as Agilent) introduced the world’s first broadband, single sweep on-wafer measurements with the 8510XF using a Cascade Microtech Summit 9000 wafer probing solution and ACP-110 probes.

Image 1:
In 1999 Keysight (as Agilent) introduced the world’s first broadband, single sweep on-wafer measurements with the 8510XF using a Cascade Microtech Summit 9000 wafer probing solution and ACP-110 probes.

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This photo shows a typical configuration of a turn-key wafer level measurement solution containing Keysight measurement instruments and the Cascade Microtech Summit 12000 probe station and Infinity probes.

Image 2:
This photo shows a typical configuration of a turn-key wafer level measurement solution containing Keysight measurement instruments and the Cascade Microtech Summit 12000 probe station and Infinity probes.

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Related Information
Press Release:
Keysight Technologies, Cascade Microtech Celebrate 25 Years of Solving Customers' Semiconductor R&D Challenges
(2016-May-23)

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